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Design and performance of AERHA, a high acceptance high resolution soft x-ray spectrometer

AERHA

April 2014

Review of Scientific Instruments 85, 043108 (2014); doi: 10.1063/1.4871362

Sorin G. Chiuzbian, Coryn F. Hague, Antoine Avila, Renaud Delaunay, Nicolas Jaouen, Maurizio Sacchi,
François Polack, Muriel Thomasset, Bruno Lagarde, Alessandro Nicolaou, Stefania Brignolo, Cédric Baumier,
Jan Lüning, and Jean-Michel Mariot

Ferrovac would like to thank the authors for mentioning us in the acknowledgment.

View online: http://dx.doi.org/10.1063/1.4871362
View Table of Contents: http://scitation.aip.org/content/aip/journal/rsi/85/4?ver=pdfcov
Published by the AIP Publishing

Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis

June 2012

Rev. Sci. Instrum. 83, 063702 (2012); http://dx.doi.org/10.1063/1.4724308

Tom Wirtz, Yves Fleming, Mathieu Gerard, Urs Gysin, Thilo Glatzel, Ernst Meyer, Urs Wegmann, Urs Maier, Aitziber Herrero Odriozola, and Daniel Uehli

State-of-the-art secondary ion mass spectrometry (SIMS) instruments allow producing 3D chemical
mappings with excellent sensitivity and spatial resolution. Several important artifacts however
arise from the fact that SIMS 3D mapping does not take into account the surface topography of
the sample. In order to correct these artifacts, we have integrated a specially developed scanning
probe microscopy (SPM) system into a commercial Cameca NanoSIMS 50 instrument. This new
SPM module, which was designed as a DN200CF flange-mounted bolt-on accessory, includes a new
high-precision sample stage, a scanner with a range of 100 μm in x and y direction, and a dedicated
SPM head which can be operated in the atomic force microscopy (AFM) and Kelvin probe force microscopy
modes. Topographical information gained from AFM measurements taken before, during,
and after SIMS analysis as well as the SIMS data are automatically compiled into an accurate 3D
reconstruction using the software program “SARINA,” which was developed for this first combined
SIMS-SPM instrument. The achievable lateral resolutions are 6 nm in the SPM mode and 45 nm in the
SIMS mode. Elemental 3D images obtained with our integrated SIMS-SPM instrument on Al/Cu and
polystyrene/poly(methyl methacrylate) samples demonstrate the advantages of the combined SIMSSPM
approach.

© 2012 American Institute of Physics.

IRMA-2 at SOLEIL: a set-up for magnetic and coherent scattering of polarized soft x-rays

April 2012

M Sacchi et al 2013 J. Phys.: Conf. Ser. 425 202009

M Sacchi, H Popescu, R Gaudemer, N Jaouen, A Avila, R Delaunay, F Fortuna, U Maier and C Spezzani

We have designed, built and tested a new instrument for soft x-ray scattering experiments. IRMA-2 is a UHV set-up for elastic and coherent scattering experiments developed at the SEXTANTS beamline of the SOLEIL synchrotron. Applications will be in the field of solid state physics, with emphasis on the investigation of the magnetic properties of artificially structured materials.

View online: iopscience.iop.org

Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy

September 2011

Volume 258, Issue 4, 1 December 2011, Pages 1322–1327

Yves Fleming, Tom Wirtz, Urs Gysin, Thilo Glatzel, Urs Wegmannb, Ernst Meyer, Urs Maier, Jörg Rychen

With the breakthroughs in lateral resolution with regards to secondary ion mass spectroscopy in recent years, new areas of research with much promise have opened up to the scientific community. Even though the much improved lateral resolution of 50 nm can effectively deliver more accurate 3D-images, the traditional 3D reconstructions, consisting of compiling previously acquired successive secondary ion mass spectrometry images into a 3D-stack, do not represent the real localized chemical distribution of the sputtered volume. Based on samples initially analyzed on the Cameca NanoSIMS 50 instrument, this paper portrays the advantages of combining the topographical information from atomic force microscopy and the chemical information from secondary ion mass spectrometry. Taking account of the roughness evolution within the analyzed zone, 3D reconstructions become a lot more accurate and allow an easier interpretation of results. On the basis of an Al/Cu sample, a comparison between traditional 3D imaging and corrected 3D reconstructions is given and the advantages of the newly developed 3D imaging method are explained.

View online: sciencedirect.com

Publications history

Advanced photoelectric effect experiment beamline at Elettra: A surface science laboratory coupled with Synchrotron Radiation

G. Panaccione, I. Vobornik, J. Fujii, D. Krizmancic, E. Annese, L. Giovanelli, F. Maccherozzi, F. Salvador, A. De Luisa, D. Benedetti, A. Gruden, P. Bertoch, F. Polack, D. Cocco, G. Sostero, B. Diviacco, M. Hochstrasser, U. Maier, D. Pescia, C. H. Back, T. Greber, J. Osterwalder, M. Galaktionov, M. Sancrotti and G. Rossi
 
Rev. Sci. Instrum. 80 , 043105 (2009) ; http://dx.doi.org/10.1063/1.3119364

Ultra-Thin Magnetic Films with Finite Lateral Size

Marty, F., C. Stamm, U. Maier, U. Ramsperger, and A. Vaterlaus
Physics of Low Dimensional Systems (Kluwer Academic / Plenum Publishers, New York), 335-349, 2001

Two-step disordering of perpendicularly magnetized ultrathin films

A. Vaterlaus, C. Stamm, U. Maier, M. G. Pini, P. Politi, and D. Pescia
6 March 2000, Physical Review Letters, 84, Number 10

Phase transition in ultrathin magnetic dots

F. Marty, A. Vaterlaus, U. Maier and D. Pescia
J. Appl. Phys. 87 , 5099 (2000) ; http://dx.doi.org/10.1063/1.373261

Ultrathin magnetic particles

F. Marty, A. Vaterlaus, V. Weich, C. Stamm, U. Maier and D. Pescia
J. Appl. Phys. 85 , 6166 (1999) ; http://dx.doi.org/10.1063/1.370031

Magnetic properties of atomically thin epitaxial dots and stripes with micrometer lateral size

U. Ramsperger, A. Vaterlaus, U. Maier, D. Pescia
Appl.Surf.Science 130-132, 889 (1998).

Two-dimensional magnetic particles

C Stamm, F Marty, A Vaterlaus, V Weich, S Egger, U Maier, U Ramsperger, H Fuhrmann, D Pescia

C. Stamm, F. Marty, A. Vaterlaus, V. Weich, S. Egger, U. Maier, D. Pescia, Laboratorium fur Festkorperphysik, Eidgenossische Technische Hochschule (ETH) Zurich, CH-8093 Zurich, Switzerland. U. Ramsperger, National Research Institute for M.
Science (Impact Factor: 31.2). 11/1998; 282(5388):449-52. DOI:10.1126/science.282.5388.449
 

ABSTRACT Single two-dimensional (2D) atomically thick magnetic particles of cobalt and iron with variable size and shape were fabricated by combining a mask technique with standard molecular beam epitaxy. Reduction of the lateral size of in-plane magnetized 2D

An ultrahigh vacuum scanning Kerr microscope

A. Vaterlaus, U. Maier, U. Ramsperger, A. Hensch and D. Pescia
Rev. Sci. Instrum. 68 , 2800 (1997) ; http://dx.doi.org/10.1063/1.1148198

Experimental confirmation of universality for a phase transition in two dimensions

Nature 378, 597 - 600 (07 December 1995); doi:10.1038/378597a0

C. H. Back, Ch. Würsch, A. Vaterlaus, U. Ramsperger, U. Maier & D. Pescia

Laboratorium fur Festkorperphysik der ETH Zurich, CH-8093 Zurich, Switzerland

WHEN a system is poised at a critical point between two macroscopic phases, it exhibits dynamical structures on all available spatial scales, even though the underlying microscopic interactions tend to have a characteristic length scale. According to the universality hypothesis1,2, diverse physical systems that share the same essential symmetry properties will exhibit the same physical behaviour close to their critical points1,3–5; if this is so, even highly idealized models can be used to describe real systems accurately. Here we report experimental confirmation that the scaling behaviour of thermodynamic variables predicted by the universality hypothesis holds over 18 orders of magnitude. We show that the equation of state of a two-dimensional system (an atomic layer of ferromagnetic iron deposited on a non-magnetic substrate) closely follows the behaviour6 of the two-dimensional Ising model7—the first and most elementary statistical model of a macroscopic system with short-range interactions3.

Atomic‐scale view of AlGaAs/GaAs heterostructures with cross‐sectional scanning tunneling microscopy

M. B. Johnson, U. Maier, H.‐P. Meier and H. W. M. Salemink
Appl. Phys. Lett. 63 , 1273 (1993) ; http://dx.doi.org/10.1063/1.109755
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